High-Speed X-ray Phase Tomography with Talbot Interferometer and Fringe Scanning Method

被引:12
|
作者
Kibayashi, Shunsuke [1 ]
Harasse, Sebastien [2 ]
Yashiro, Wataru [2 ]
Momose, Atsushi [2 ]
机构
[1] Univ Tokyo, Dept Appl Phys, Fac Engn, 5-1-5 Kashiwanoha, Kashiwa, Chiba 2778561, Japan
[2] Univ Tokyo, Grad Sch Frontier Sci, Dept Adv Mat Sci, Tokyo 1138654, Japan
基金
日本科学技术振兴机构;
关键词
Phase imaging; Grating; Interferometer; Talbot interferometer; Tomography; Time resolved observation; WHITE SYNCHROTRON-RADIATION;
D O I
10.1063/1.4742302
中图分类号
O59 [应用物理学];
学科分类号
摘要
High-speed X-ray phase tomography based on the Fourier-transform method has been demonstrated with an X-ray Talbot interferometer using white synchrotron radiation. We report the experimental results of high-speed X-ray phase tomography with fringe-scanning method instead of Fourier-transform method to improve spatial resolution without a considerable increase of scan time. To apply fringe-scanning method to high speed tomography, we tested a scan that is a synchronous combination of one-way continuous movements of the sample rotation and the grating displacement. When this scanning method was combined with X-ray phase tomography, we were able to obtain a scan time of 5 s. A comparison of the image quality derived with the conventional approach and with the proposed approach using the fringe-scanning method showed that the latter had better spatial resolution.
引用
收藏
页码:261 / 265
页数:5
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