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- [1] 7nm FinFET Standard Cell Layout Characterization and Power Density Prediction in Near- and Super-Threshold Voltage Regimes 2014 INTERNATIONAL GREEN COMPUTING CONFERENCE (IGCC), 2014,
- [3] A Characterization Method for Standard Cell Library at Near-Threshold Voltage Hunan Daxue Xuebao/Journal of Hunan University Natural Sciences, 2019, 46 (04): : 85 - 90
- [4] Standard-cell design architecture options below 5nm node: the ultimate scaling of FinFET and Nanosheet DESIGN-PROCESS-TECHNOLOGY CO-OPTIMIZATION FOR MANUFACTURABILITY XIII, 2019, 10962
- [5] A Standard Cell Optimization Method for Near-Threshold Voltage Operations INTEGRATED CIRCUIT AND SYSTEM DESIGN: POWER AND TIMING MODELING, OPTIMIZATION AND SIMULATION, 2013, 7606 : 32 - 41
- [7] A Flexible Structure of Standard Cell and Its Optimization Method for Near-Threshold Voltage Operation 2012 IEEE 30TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD), 2012, : 235 - 240
- [8] A 0.6V Standard Cell Library in 40nm CMOS for Near-threshold Computing 2016 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2016, : 279 - 282