Electrical Degradation due to Treeing in Nanocomposite Dielectric Materials with Impurities

被引：0

作者：

Pitsa, D. ^{[1
]}

Danikas, M. G. ^{[1
]}

机构：

[1] Democritus Univ Thrace, Dept Elect & Comp Engn, GR-67100 Xanthi, Greece

来源：

2012 IEEE 10TH INTERNATIONAL CONFERENCE ON THE PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS (ICPADM) | 2012年

关键词：

electrical degradation; treeing; nanocomposite dielectrics; impurities; cellular automata;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Treeing phenomena in nanocomposite dielectric materials due to the presence of impurities are investigated using a Cellular Automata (CA) model. A needle-plane electrode configuration under the application of a DC voltage is used in order to examine the degradation that is caused by electrical trees that initiate from impurities in titania/epoxy nanocomposites. Air-filled voids and conductive particles comprise impurities from which electrical trees initiate and propagate in the dielectric material. The simulation results indicate that the presence of impurities provokes degradation of the nanocomposite dielectric. The degree of degradation depends on the number of impurities presence within the dielectric. Additionally, it is observed that the trees that initiate from impurities are hindered by the nanoparticles presence.

引用

页数：4

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