This work presents the fabrication and electrical characterization of the Ion-Sensitive Field Effect Transistor (ISFET) exposed to hydrogen peroxide solutions. Two configurations were set up to evaluate the sensitivity of the devices to the concentration of the solution. First, measurements with one electrode in the sample solution (contained over the gate area) were performed; however, due to the prevalence of secondary effects, the results may not be directly related to the characteristics of the solution. The second method, using two electrodes in the sample solution, shows a higher sensitivity at increasing H2O2 concentrations, and in decreasing intervals, when compared to measurements with one electrode.
机构:
Hong Kong Polytech Univ, Dept Civil & Struct Engn, Kowloon, Hong Kong, Peoples R ChinaHong Kong Polytech Univ, Dept Civil & Struct Engn, Kowloon, Hong Kong, Peoples R China
Xu, Xiang-Rong
Li, Xiao-Yan
论文数: 0引用数: 0
h-index: 0
机构:
Univ Hong Kong, Dept Civil Engn, Environm Engn Res Ctr, Hong Kong, Hong Kong, Peoples R ChinaHong Kong Polytech Univ, Dept Civil & Struct Engn, Kowloon, Hong Kong, Peoples R China
Li, Xiao-Yan
Li, Xiang-Zhong
论文数: 0引用数: 0
h-index: 0
机构:
Hong Kong Polytech Univ, Dept Civil & Struct Engn, Kowloon, Hong Kong, Peoples R ChinaHong Kong Polytech Univ, Dept Civil & Struct Engn, Kowloon, Hong Kong, Peoples R China
Li, Xiang-Zhong
Li, Hua-Bin
论文数: 0引用数: 0
h-index: 0
机构:
Univ Hong Kong, Sch Biol Sci, Hong Kong, Hong Kong, Peoples R ChinaHong Kong Polytech Univ, Dept Civil & Struct Engn, Kowloon, Hong Kong, Peoples R China