Pulse picking in synchrotron-based XPEEM

被引:2
|
作者
Aballe, Lucia [1 ]
Foerster, Michael [1 ]
Cabrejo, Meritxell [1 ]
Prat, Jordi [1 ]
Pittana, Paolo [2 ]
Sergo, Rudi [2 ]
Lucian, Matteo [2 ]
Barnaba, Maurizio [2 ]
Mentes, Tevfik Onur [2 ]
Locatelli, Andrea [2 ]
机构
[1] ALBA Synchrotron, Carrer Llum 2-26, Cerdanyola Del Valles 08290, Spain
[2] Elettra Sincrotrone Trieste, Str Statale 14 Km 163-5 AREA Sci Pk, I-34149 Trieste, Italy
关键词
PHOTOEMISSION ELECTRON-MICROSCOPY; SPELEEM; LEEM;
D O I
10.1016/j.ultramic.2019.03.011
中图分类号
TH742 [显微镜];
学科分类号
摘要
We report on a simple and cost-effective device for high-speed gating in photoemission electron microscopy (PEEM) with pulsed photon sources. This device is based on miniaturized electrode plates, which deflect the photoelectron beam inside the imaging column of the microscope so that it is either accepted or blocked in its path towards the detector. The gating device is optimized for installation on the Elmitec SPELEEM III microscope. Due to the compact design, it can be driven by voltage pulses of low amplitude (few volts), delivered by commercially available signal generators. Most notably, our device allows for stroboscopic data collection with on-time of less than 10 ns and at a rate in the range from 1 MHz to 250 MHz, making it suitable for usage in both hybrid and standard multi-bunch operation of the synchrotron ring. We demonstrate applications of pump-probe imaging at high lateral resolution, namely magnetic imaging and PEEM imaging of surface acoustic waves.
引用
收藏
页码:10 / 17
页数:8
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