Pulse picking in synchrotron-based XPEEM

被引:2
|
作者
Aballe, Lucia [1 ]
Foerster, Michael [1 ]
Cabrejo, Meritxell [1 ]
Prat, Jordi [1 ]
Pittana, Paolo [2 ]
Sergo, Rudi [2 ]
Lucian, Matteo [2 ]
Barnaba, Maurizio [2 ]
Mentes, Tevfik Onur [2 ]
Locatelli, Andrea [2 ]
机构
[1] ALBA Synchrotron, Carrer Llum 2-26, Cerdanyola Del Valles 08290, Spain
[2] Elettra Sincrotrone Trieste, Str Statale 14 Km 163-5 AREA Sci Pk, I-34149 Trieste, Italy
关键词
PHOTOEMISSION ELECTRON-MICROSCOPY; SPELEEM; LEEM;
D O I
10.1016/j.ultramic.2019.03.011
中图分类号
TH742 [显微镜];
学科分类号
摘要
We report on a simple and cost-effective device for high-speed gating in photoemission electron microscopy (PEEM) with pulsed photon sources. This device is based on miniaturized electrode plates, which deflect the photoelectron beam inside the imaging column of the microscope so that it is either accepted or blocked in its path towards the detector. The gating device is optimized for installation on the Elmitec SPELEEM III microscope. Due to the compact design, it can be driven by voltage pulses of low amplitude (few volts), delivered by commercially available signal generators. Most notably, our device allows for stroboscopic data collection with on-time of less than 10 ns and at a rate in the range from 1 MHz to 250 MHz, making it suitable for usage in both hybrid and standard multi-bunch operation of the synchrotron ring. We demonstrate applications of pump-probe imaging at high lateral resolution, namely magnetic imaging and PEEM imaging of surface acoustic waves.
引用
收藏
页码:10 / 17
页数:8
相关论文
共 50 条
  • [1] Synchrotron-based impurity mapping
    McHugo, SA
    Thompson, AC
    Flink, C
    Weber, ER
    Lamble, G
    Gunion, B
    MacDowell, A
    Celestre, R
    Padmore, HA
    Hussain, Z
    JOURNAL OF CRYSTAL GROWTH, 2000, 210 (1-3) : 395 - 400
  • [2] Synchrotron-based photoelectron microscopy
    Barinov, Alexei
    Dudin, Pavel
    Gregoratti, Luca
    Locatelli, Andrea
    Mentes, Tevfik Onur
    Nino, Miquel Angel
    Kiskinova, Maya
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2009, 601 (1-2): : 195 - 202
  • [3] Towards synchrotron-based nanocharacterization
    Bleuet, Pierre
    Arnaud, Lucile
    Biquard, Xavier
    Cloetens, Peter
    Doyen, Lise
    Gergaud, Patrice
    Lamontagne, Patrick
    Lavayssiere, Maylis
    Micha, Jean-Sebastien
    Renault, Olivier
    Rieutord', Francois
    Susini, Jean
    Ulrich, Olivier
    FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009, 2009, 1173 : 181 - +
  • [4] High-speed nuclear quality Pulse Height Analyzer for synchrotron-based applications
    Bêche, JF
    Bucher, JJ
    Fabris, L
    Riot, VJ
    Shuh, DK
    2001 IEEE NUCLEAR SCIENCE SYMPOSIUM, CONFERENCE RECORDS, VOLS 1-4, 2002, : 689 - 692
  • [5] High-speed nuclear quality Pulse Height Analyzer for synchrotron-based applications
    Bêche, JF
    Bucher, JJ
    Fabris, L
    Riot, VJ
    Shuh, DK
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (03) : 1195 - 1198
  • [6] Synchrotron-based Nickel Mossbauer Spectroscopy
    Gee, Leland B.
    Lin, Chun-Yi
    Jenney, Francis E., Jr.
    Adams, Michael W. W.
    Yoda, Yoshitaka
    Masuda, Ryo
    Saito, Makina
    Kobayashi, Yasuhiro
    Tamasaku, Kenji
    Lerche, Michael
    Seto, Makoto
    Riordan, Charles G.
    Ploskonka, Ann
    Power, Philip P.
    Cramer, Stephen P.
    Lauterbach, Lars
    INORGANIC CHEMISTRY, 2016, 55 (14) : 6866 - 6872
  • [7] Obtaining access to synchrotron-based techniques
    Bertsch, PM
    Schulze, DG
    SYNCHROTRON X-RAY METHODS IN CLAY SCIENCE, 1999, 9 : 240 - 244
  • [8] Synchrotron-based Compton scattering studies
    Manninen, S
    RADIATION PHYSICS AND CHEMISTRY, 1998, 51 (4-6): : 481 - 486
  • [9] New developments in synchrotron-based microtomography
    Stampanoni, M
    Abela, R
    Borchert, G
    Patterson, BD
    DEVELOPMENTS IN X-RAY TOMOGRAPHY IV, 2004, 5535 : 169 - 181
  • [10] XPEEM spectromicroscopy using synchrotron radiation
    Barrett, N.
    Renault, O.
    MATERIAUX & TECHNIQUES, 2009, 97 (02): : 101 - 122