Hydrogen and Pb defects at the (111)Si-SiO2 interface:: An ab initio cluster study

被引:32
|
作者
Tuttle, B
机构
[1] Univ Illinois, Dept Phys, Urbana, IL 61801 USA
[2] Univ Illinois, Beckman Inst, Urbana, IL 61801 USA
关键词
D O I
10.1103/PhysRevB.60.2631
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Employing ab initio density functional methods and atomistic cluster models, we investigate the properties of P-b defects and their interactions with hydrogen at the (111)Si-SiO2 interface. Our calculated hyperfine parameters agree quantitatively with experiments indicating that the P-b defect is a silicon dangling bond at the silicon side of the interface. We calculate the local minimum energy structures for one and two hydrogen atoms interacting with the P-b defect. From these calculations, we derive reaction energies for H-2 adsorption and H desorption. Comparing our results to experimentally derived activation barriers, we suggest different atomistic mechanisms for the observed reactions. [S0163-1829(99)05228-5].
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页码:2631 / 2637
页数:7
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