What can the ABCD parameters tell us about the TRL?

被引:0
|
作者
Reynoso-Hernandez, J. A. [1 ]
Pulido-Gaytan, M. A. [1 ]
Maya-Sanchez, M. C. [1 ]
Loo-Yau, J. R. [2 ]
机构
[1] CICESE, Carretera Ensenada Tijuana,3918,Zona Playitas, Ensenada 22860, Baja California, Mexico
[2] Ctr Investigac & Estudios Avanzados IPN Undad Gu, Mexico City, DF, Mexico
关键词
ABCD-parameters; offset short; waveguides; waveguide sliding short; TRL calibration;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using ABCD parameters and the 8-term error model to represent a non-ideal vector network analyzer (VNA), a new procedure for implementing the Thru-Reflect-Line calibration technique (TRL) is introduced. The novelty of this TRL is the use of ABCD-parameters, instead of transmission parameters, to represent a non-ideal vector network analyzer (VNA). Moreover, this new approach demonstrates, theoretically, the use of lines with complex characteristic impedance as calibration elements. To validate the new TRL procedure, the phase and magnitude of a waveguide sliding short is measured and corrected with the classical TRL. The results are in good agreement, which validates the proposed method.
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页数:4
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