Effect of light irradiation and forward bias during PID tests of CIGS PV modules

被引：0
|
作者：
Sakurai, Keiichiro [1 ]
Tomita, Hiroshi [2 ]
Ogawa, Kinichi [1 ]
Schmitz, Darshan [2 ]
Shibata, Hajime [1 ]
Tokuda, Shuuji [2 ]
Masuda, Atsushi [1 ]
机构：
[1] Natl Inst Adv Ind Sci & Technol, AIST 2-20273080,1-1-1 Umezono, Tsukuba, Ibaraki 3058568, Japan
[2] Solar Frontier KK, 123-1 Shimokawairi, Atsugi, Kanagawa 2430206, Japan
来源：
RELIABILITY OF PHOTOVOLTAIC CELLS, MODULES, COMPONENTS, AND SYSTEMS X | 2017年 / 10370卷
关键词：
CIGS; CIS; Test-specific degradation; TSD; PID;
D O I：
10.1117/12.2275348
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
We have conducted potential induced degradation (PID) tests on CIGS photovoltaic (PV) modules with/without LED white light irradiation. Suppression of PID degradation was observed by light irradiation
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页数：3
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