Study of Frequency-to-Voltage Converter immunity to fast transient pulses

被引：0
|
作者：
Gao, Yuan [1 ]
Abouda, Kamel [1 ]
Beges, Remi [1 ]
Besse, Patrice [1 ]
机构：
[1] NXP Semicond, ESD EMC Team Cent Org Automot Div, Toulouse, France
来源：
2016 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC) | 2016年
关键词：
FVC; ISO pulse; immunity; fast transient;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper the susceptibility of a Frequency-to-Voltage Convertor (FVC) to harsh automotive EMC/ESD environment using different system level ISO pulses are investigated by circuit simulations. A simplification methodology of power tree is presented and used for simulation acceleration. We evaluated the performance of the on-chip FCV under several different standard ISO pulses. As the results, we have clarified the mechanism of the FVC malfunction.
引用
收藏
页码：849 / 851
页数：3
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