New interferometric methods for group-delay measurement using white-light illumination

被引:0
|
作者
Kovacs, AP
Kurdi, G
Osvay, K
Szipocs, R
Hebling, J
Bor, Z
机构
关键词
D O I
暂无
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
引用
收藏
页码:607 / 611
页数:5
相关论文
共 50 条
  • [21] THE GEOMETRIC PHASE - INTERFEROMETRIC OBSERVATIONS WITH WHITE-LIGHT
    HARIHARAN, P
    LARKIN, KG
    ROY, M
    JOURNAL OF MODERN OPTICS, 1994, 41 (04) : 663 - 667
  • [22] DETECTION SCHEME FOR WHITE-LIGHT INTERFEROMETRIC SENSORS
    GIOVANNINI, HR
    YEDDOU, D
    HUARD, SJ
    LEQUIME, MR
    FROEHLY, C
    OPTICS LETTERS, 1993, 18 (23) : 2074 - 2076
  • [23] WHITE-LIGHT INTERFEROMETRIC FIBEROPTIC PRESSURE SENSOR
    BOCK, WJ
    URBANCZYK, W
    WOJCIK, J
    BEAULIEU, M
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (03) : 694 - 697
  • [24] Optimization of white-light interferometric temperature sensor
    Jedrzejewsak-Szczerska, M
    Hypszer, R
    ATOMIC AND MOLECULAR PHYSICS, 2003, 5258 : 202 - 205
  • [25] Direct measurement of group delay with joint time-frequency analysis of a white-light spectral interferogram
    Deng, Yuqiang
    Yang, Weijian
    Zhou, Chun
    Wang, Xi
    Tao, Jun
    Kong, Weipeng
    Zhang, Zhigang
    OPTICS LETTERS, 2008, 33 (23) : 2855 - 2857
  • [26] VERSATILE AND ACCURATE METHOD OF GROUP-DELAY MEASUREMENT
    GALPIN, RKP
    ELECTRONICS LETTERS, 1968, 4 (02) : 23 - &
  • [27] WHITE-LIGHT HOLOGRAPHY UTILIZING SOLAR ILLUMINATION
    RUTERBUSCH, PH
    APPLIED OPTICS, 1983, 22 (22): : 3475 - 3475
  • [28] Structured white-light illumination for diagnostic investigations
    Schau, P.
    Brandes, A.
    Frenner, K.
    Kienle, A.
    Osten, W.
    OPTICAL METHODS FOR INSPECTION, CHARACTERIZATION, AND IMAGING OF BIOMATERIALS, 2013, 8792
  • [29] Measurement of the group refractive index of bulk material using white-light spectral interferometry
    Zhang Shu-Na
    Luo Zhen-Yue
    Shen Wei-Dong
    Liu Xu
    Zhang Yue-Guang
    ACTA PHYSICA SINICA, 2011, 60 (01)
  • [30] Direct measurement of group dispersion of optical components using white-light spectral interferometry
    Chlebus, R.
    Hlubina, P.
    Ciprian, D.
    OPTO-ELECTRONICS REVIEW, 2007, 15 (03) : 144 - 148