SNR Metric and Crosstalk in Color Image Sensor of Small Size Pixel

被引：0

作者：

Ahn, JungChak ^{[1
]}

Kim, Bumsuk ^{[1
]}

Lee, Kyungho ^{[1
]}

Choi, Sangjun ^{[1
]}

Jeong, Heegeun ^{[1
]}

Kim, Hongki ^{[1
]}

Hiroshige, Goto ^{[1
]}

Choi, Chi-Young ^{[1
]}

Lee, Duckhyung ^{[1
]}

机构：

[1] Samsung Elect Co Ltd, Syst LSI Div, Yongin 446711, Gyeonggi Do, South Korea

来源：

2013 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS (VLSI-TSA) | 2013年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

According to the high resolution trend in CMOS image sensor, pixel size is shrinking continuously towards and beyond 1.0um and reaching technical barrier to get the required performance. To achieve high SNR's in both low and high illumination, while high sensitivity and high full well capacity are essential but limited by pixel size of around 1.0um, reduction of crosstalk is more efficient way, which makes 'effectively' sensitivity and full well capacity higher. In this paper, successful demonstration of ultralow crosstalk high SNR pixel will be presented.

引用

页数：2

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