共 50 条
- [46] Non-destructive monitoring of silicon consumption during shallow trench isolation formation on 45nm node devices using spectroscopic ellipsometry ISSM 2006 CONFERENCE PROCEEDINGS- 13TH INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING, 2006, : 464 - 467
- [50] Non-Destructive Prediction of Moisture Content and Freezable Water Content of Purple-Fleshed Sweet Potato Slices during Drying Process Using Hyperspectral Imaging Technique Food Analytical Methods, 2017, 10 : 1535 - 1546