Difference Set Codes for Soft Error Protection in Memories

被引：0

作者：

Thomas, Temina K. ^{[1
]}

Mangai, N. . M. Siva ^{[1
]}

机构：

[1] Karunya Univ, Dept Elect & Commun Engn, Coimbatore, Tamil Nadu, India

来源：

2014 INTERNATIONAL CONFERENCE ON ELECTRONICS AND COMMUNICATION SYSTEMS (ICECS) | 2014年

关键词：

Soft errors; Difference set cyclic codes; One step majority logic decoding; Correction threshold;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Radiation induced soft errors has become a major concern in semiconductor industries because it seriously affect the reliability of devices. Due to technology scaling, multiple cell upsets (MCU) has become more common and affect a large number of cells. In order to protect the memories from MCU, advanced error correcting codes (ECC) can be used to correct multiple errors. The major drawback of these codes is their increased decoding complexity. By using the one step majority logic decodable codes (OS-MLD) the decoding complexity can be reduced. Difference set (DS) codes are one example of OS-MLD codes. In this paper a technique is explained to provide enhanced error correction capability of DS codes, by placing the bits in the memory in such a way to exploit the localization of errors caused by MCU.

引用

页数：5

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