The electron energy distribution from very sharp field emitters

被引：0
|
作者：
Forbes, RG
机构：
来源：
IVMC '96 - 9TH INTERNATIONAL VACUUM MICROELECTRONICS CONFERENCE, TECHNICAL DIGEST | 1996年
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Controversy exists about the electron energy distribution from a very sharp tungsten field emitter that ends in a single atom. It has been proposed that observation of a double-peaked energy distribution proves that field emission is taking place through a single atom on the top of a so-called teton tip. It is suggested here that this observation is not conclusive, because the present author has observed similar distributions when performing field electron energy analysis on gallium phosphide emitters that were not specially sharpened.
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页码：58 / 61
页数：4
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