Using FSV with Far-Field Patterns

被引：0

作者：

Johnson, Michael R. ^{[1
]}

Coffey, Edgar L., III ^{[2
]}

机构：

[1] USAF, SEEK EAGLE Off, Eglin AFB, FL 32542 USA

[2] Appl Res Assoc Inc, Belcamp, MD 21017 USA

来源：

2012 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC) | 2012年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Feature Selection Validation has now become an IEEE Standard, and is gaining popularity in the Computational Electromagnetic Community. As with any new approach it presents new and unique challenges to the user. This paper explores the use of Feature Selection Validation for evaluating far-field patterns in several examples and discusses some practical limitation discovered. One important conclusion that must be drawn is that context remains the most important aspect of evaluating results with the Feature Selection Validation process.

引用

页码：686 / 691

页数：6

共 50 条

[11] FAR-FIELD RADIATION PATTERNS OF SPHERICAL SUBREFLECTOR.
Chandra Mouly, M.C.
Journal of the Institution of Engineers (India), Part ET: Electronics & Telecommunication Engineer, 1982, 62 : 75 - 78
[12] Far-field Gain Estimation in Tissue Equivalent Liquid Using Measured Data in Far-field Region
Shiga, Hiroki
Ikarashi, Naoto
Ishii, Nozomu
Sato, Ken-ichi
Hamada, Lira
Watanabe, Soichi
2007 ASIA PACIFIC MICROWAVE CONFERENCE, VOLS 1-5, 2007, : 2408 - +
[13] SIMULTANEOUS RECORDING OF NEAR-FIELD AND FAR-FIELD PATTERNS OF LASERS
BIRKY, MM
APPLIED OPTICS, 1969, 8 (11): : 2249 - &
[14] Efficient calculation of far-field patterns of waveguide discontinuities using perfectly matched layers
Derudder, H
Olyslager, F
De Zutter, D
ELECTRONICS LETTERS, 2000, 36 (09) : 798 - 799
[15] Far-field ultrasonic imaging using hyperlenses
Mohamed Subair Syed Akbar Ali
Prabhu Rajagopal
Scientific Reports, 12
[16] Far-field ultrasonic imaging using hyperlenses
Ali, Mohamed Subair Syed Akbar
Rajagopal, Prabhu
SCIENTIFIC REPORTS, 2022, 12 (01)
[17] Diffraction patterns of optical discs under the far-field condition
Cai, Zhuofan
Chen, Shijiang
Deng, Boyang
Liu, Shuqi
Zhao, Wei
Zhang, Zengming
EUROPEAN JOURNAL OF PHYSICS, 2024, 45 (02)
[18] Far-field diffraction patterns of circular sectors and related apertures
Urcid, G
Padilla, A
APPLIED OPTICS, 2005, 44 (36) : 7677 - 7696
[19] Optical patterns control in semiconductor microresonators in a far-field case
Kheradmand, R.
Tajalli, H.
Dastmalchi, B.
OPTOELETRONIC MATERIALS AND DEVICES, PTS 1 AND 2, 2006, 6352
[20] Wideband Characteristic Mode Tracking Utilizing Far-Field Patterns
Miers, Zachary
Lau, Buon Kiong
IEEE ANTENNAS AND WIRELESS PROPAGATION LETTERS, 2015, 14 : 1658 - 1661

← 1 2 3 4 5 →