Signal amplitude and sensitivity of the Kelvin probe force microscopy

被引：11
|
作者：
Ouisse, T
Martins, F
Stark, M
Huant, S
Chevrier, J
机构：
[1] Univ Grenoble 1, Spectrometrie Phys Lab, F-38042 St Martin Dheres, France
[2] Univ Grenoble 1, Spectrometrie Phys Lab, F-38042 St Martin Dheres, France
[3] CNRS, UMR C5588, F-38042 St Martin Dheres, France
[4] CNRS, LEPES, F-38042 Grenoble 9, France
[5] European Synchrotron Radiat Facil, F-38043 Grenoble, France
来源：
APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 04期
关键词：
D O I：
10.1063/1.2168251
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
When the tip-sample distance is small, Kelvin probe force microscopy is affected by parametric amplification. This is due to the fact that the electric force has two components; the higher one having a frequency exactly twice as high as the lower. The oscillation amplitude may substantially depart from what is usually expected. Those phenomena are analytically modeled and experimentally shown, and the optimal parameter values which must be used for voltage detection are established.
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页码：1 / 3
页数：3
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