Sensitivity of extended x-ray-absorption fine structure to thermal expansion

被引:148
|
作者
Dalba, G [1 ]
Fornasini, P
Grisenti, R
Purans, J
机构
[1] Univ Trent, Dipartimento Fis, I-38050 Trento, Italy
[2] Latvian State Univ, Inst Solid State Phys, LV-1063 Riga, Latvia
[3] Ist Nazl Fis Mat, I-38050 Trento, Italy
关键词
D O I
10.1103/PhysRevLett.82.4240
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The sensitivity of extended x-ray-absorption tine structure (EXAFS) to thermal expansion has been studied by temperature-dependent measurements on germanium. The first cumulant does not reproduce the thermal expansion owing to vibrations normal to the bond. The perpendicular relative displacement [Delta u(perpendicular to)(2)] has been for the first time experimentally obtained; the ratio [Delta u(perpendicular to)(2)]/[Delta u(parallel to)(2)] is in agreement with vibrational model calculations. Low-temperature quantum effects on the 3rd cumulant have been for the first time observed. The possibility of measuring thermal expansion from the 3rd cumulant is demonstrated, provided that quantum effects are taken into account. [S0031-9007(99)09215-7].
引用
收藏
页码:4240 / 4243
页数:4
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