Defect energetics and Xe diffusion in UO2 and ThO2

被引:58
|
作者
Yun, Younsuk [1 ]
Oppeneer, Peter M. [1 ]
Kim, Hanchul [2 ]
Park, Kwangheon [3 ]
机构
[1] Uppsala Univ, Dept Phys & Mat Sci, S-75121 Uppsala, Sweden
[2] Sookmyung Womens Univ, Dept Phys, Seoul 140702, South Korea
[3] Kyung Hee Univ, Dept Nucl Engn, Suwon 449701, South Korea
关键词
Formation energy; Migration energy; Resistance against oxidation; Fission gas release; Vacancy-assisted mechanism; INITIO MOLECULAR-DYNAMICS; TOTAL-ENERGY CALCULATIONS; WAVE BASIS-SET; PSEUDOPOTENTIAL APPROACH; URANIUM-DIOXIDE; THORIA; XENON; REACTORS; METALS; FUELS;
D O I
10.1016/j.actamat.2008.12.010
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have performed ab initio total energy calculations to investigate the defect energetics and diffusion behavior of Xe in UO2 and ThO2 matrices. All calculations have been carried out Using density functional theory within the generalized gradient approximation and applying the projector-augmented-wave method. Our results Show that the formation and migration energies of vacancy defects are more than twice as high in ThO2 compared with UO2. Another notable difference between the two oxides is the role played by an oxygen vacancy ill the movement of a cation vacancy. An vacancy enhances the movement Of a uranium vacancy by lowering its migration energy by about 1 eV, but a similar effect is not observed in ThO2. The different behavior of cation vacancies in the two oxides strongly affects the mobility of fission gases and leads to differences in their respective diffusion behavior. We sui, est that the strong resistance against oxidation of ThO2 prevents the creation and migration of defects. and results ill a lower mobility of fission gases ill ThO2 as compared to UO2. (C) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:1655 / 1659
页数:5
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