Permittivity measurements and associated uncertainties up to 110 GHz in circular-disk resonator method

被引:0
|
作者
Kato, Yuto [1 ]
Horibe, Masahiro [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, 1-1-1 Umezono, Tsukuba, Ibaraki 3058568, Japan
来源
2016 46TH EUROPEAN MICROWAVE CONFERENCE (EUMC) | 2016年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have measured the complex permittivity of plate samples and evaluated those uncertainties up to 11110 GHz by using a balanced-type circular-disk resonator. By an electromagnetic excitation in the center from coaxial lines, only the TM0m0 modes are selectively excited, so broadband measurements from 5 to 110 GHz can be performed by a single resonator by utilizing higher order modes. We have evaluated measurement uncertainties by rigorously considering the uncertainty propagations of measured S-parameters and dimensions. The obtained results are compared with those obtained by the split-cylinder resonator method, and they agree rather well with each other within the ranges of uncertainties.
引用
收藏
页码:1139 / 1142
页数:4
相关论文
共 50 条
  • [41] A new open resonator method for the measurement of dielectric permittivity and loss tangent of low absorbing materials at 60 GHz
    Afsar, MN
    Ding, HY
    2000 25TH INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES CONFERENCE DIGEST, 2000, : 403 - 404
  • [42] Characterization of Cross-Line up to 110 GHz Using Two-Port Measurements
    Tokgoz, Korkut Kaan
    Maki, Shotaro
    Okada, Kenichi
    Matsuzawa, Akira
    2015 IEEE INTERNATIONAL SYMPOSIUM ON RADIO-FREQUENCY INTEGRATION TECHNOLOGY (RFIT), 2015, : 97 - 99
  • [43] Ultra High-Q 60GHz Open Resonator System for Precision Dielectric Permittivity and Loss Tangent Measurements
    Quan, Wei
    Afsar, M. N.
    2018 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC): DISCOVERING NEW HORIZONS IN INSTRUMENTATION AND MEASUREMENT, 2018, : 1692 - 1696
  • [44] Responsivity Measurements up to 110 GHz Using AlGaN/GaN HEMTs with Different Gate Size
    Iniguez-de-la-Torre, I.
    Artillan, Philippe
    Paz-Martinez, Gaudencio
    Rochefeuille, Edouard
    Gonzalez, T.
    Mateos, J.
    2023 INTERNATIONAL WORKSHOP ON INTEGRATED NONLINEAR MICROWAVE AND MILLIMETRE-WAVE CIRCUITS, INMMIC, 2023,
  • [45] A Simple Through-Only De-Embedding Method for On-Wafer S-Parameter Measurements up to 110 GHz
    Ito, Hiroyuki
    Masu, Kazuya
    2008 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-4, 2008, : 382 - +
  • [46] Millimeter wave measurements of temperature dependence of complex permittivity of GaAs plates by a circular waveguide method
    Shimizu, T
    Kobayashi, Y
    2001 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2001, : 2195 - 2198
  • [47] A Two-step De-embedding Method Valid up to 110 GHz
    Bazzi, J.
    Kasssem, H.
    Curutchet, A.
    Pourchon, F.
    Derrier, N.
    Celi, D.
    Zimmer, T.
    2017 29TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS (ICM), 2017, : 298 - 301
  • [48] Plano-Concave Fabry-Perot Open Resonator for Measurements of Conductivity up to 70 GHz
    Cuper, Jerzy
    Salski, Bartlomiej
    Pacewicz, Adam
    Kopyt, Pawel
    2024 25TH INTERNATIONAL MICROWAVE AND RADAR CONFERENCE, MIKON 2024, 2024, : 314 - +
  • [49] Complex Permittivity Measurement of Aluminum Nitride by the cut-off circular waveguide method from 40GHz to 100GHz
    Shimizu, Takashi
    Kawahara, Yuki
    Akasaka, Seizo
    Kogami, Yoshinori
    ASIA-PACIFIC MICROWAVE CONFERENCE 2011, 2011, : 1450 - 1453
  • [50] Complex Permittivity Extraction of IC-Package Materials beyond 110 GHz by Band-Limited Waveguide-Cavity Measurements
    Pfahler, Tim
    Gold, Gerald
    Bachbauer, Felix
    Schuer, Jan
    Vossiek, Martin
    2023 53RD EUROPEAN MICROWAVE CONFERENCE, EUMC, 2023, : 568 - 571