Two Dimensional Grazing Incidence X-Ray Diffraction of TIPS-Pentacene Thin Films

被引：2

作者：

Kamiya, R. ^{[1
]}

Hosokai, T. ^{[1
]}

Watanabe, T. ^{[1
]}

Koganezawa, T. ^{[2
]}

Kikuchi, M. ^{[1
]}

Yoshimoto, N. ^{[1
]}

机构：

[1] Iwate Univ, Grad Sch Engn, Morioka, Iwate 0208551, Japan

[2] Japan Synchrotron Radiat Res Inst, Sayo, Hyogo, Japan

来源：

MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 2012年 / 568卷

关键词：

Organic semiconductors; TIPS-pentacene; X-ray diffraction; 2D-GIXD; polymorph; FUNCTIONALIZED PENTACENE; TRANSISTORS;

D O I：

10.1080/15421406.2012.710306

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We report crystal structure of TIPS-pentacene thin films studied by two dimensional grazing incidence x-ray diffraction (2D-GIXD). Thin films were fabricated by dry and wet processes, and precisely compared the crystal structures of the fabricated films. Slight differences in the unit cell parameters are found in the films. Furthermore, a new polymorph is identified in the film fabricated at sufficiently low substrate temperature, - 166 degrees C. The unit cell parameters of the new polymorph are determined by analyzing the 2D-GIXD pattern.

引用

页码：134 / 138

页数：5

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