Separation algorithm for bulk lifetime and surface recombination velocity of thick silicon wafers and bricks via time-resolved photoluminescence decay

被引：11

作者：

Wang, Kai ^{[1
]}

Kampwerth, Henner ^{[1
]}

机构：

[1] Univ New S Wales, Sch Photovolta & Renewable Energy Engn, Sydney, NSW 2052, Australia

来源：

JOURNAL OF APPLIED PHYSICS | 2014年 / 115卷 / 17期

关键词：

DYNAMIC PHOTOLUMINESCENCE; PHOTOCONDUCTANCE;

D O I：

10.1063/1.4874916

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present a method to simultaneously determine bulk and surface recombination properties using time-resolved photoluminescence (PL) decay. The lifetime separation algorithm makes use of the analytical expression of the asymptotic separation of two time-resolved PL decays corresponding to different excitation wavelengths as well as that of the ratio of two steady-state PL intensities excited by the two different wavelengths. Detailed experimental methods of measuring these two terms are presented and the effect of signal-to-noise ratio is discussed to determine the applicability of this algorithm. (C) 2014 AIP Publishing LLC.

引用

页数：5

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