Automated extraction of the short-range part of the interaction in non-contact atomic force microscopy

被引：2
|
作者：
Diao, Zhuo [1 ]
Katsube, Daiki [1 ,2 ]
Yamashita, Hayato [1 ]
Sugimoto, Yoshiaki [3 ]
Custance, Oscar [4 ]
Abe, Masayuki [1 ]
机构：
[1] Osaka Univ, Grad Sch Engn Sci, 1-3 Machikaneyama, Toyonaka, Osaka 5600043, Japan
[2] Nagaoka Univ Technol, Grad Sch Engn, 1603-1 Kamitomiokamachi, Nagaoka, Niigata 9402188, Japan
[3] Univ Tokyo, Dept Adv Mat Sci, Kashiwanoha 5-1-5, Kashiwa, Chiba 2278561, Japan
[4] Natl Inst Mat Sci NIMS, 1-2-1 Sengen, Tsukuba, Ibaraki 3050047, Japan
来源：
APPLIED PHYSICS LETTERS | 2020年 / 117卷 / 03期
关键词：
DISCOVERY;
D O I：
10.1063/5.0007754
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A method for the automated extraction of the short-range part of the probe-surface interaction from force spectroscopy curves is presented. Our algorithm consists of two stages: the first stage determines a boundary that separates the region where the short-range interaction is dominantly acting on the probe and a second stage that finds the parameters to fit the interaction over the long-range region. We applied this method to force spectroscopy maps acquired over the Si(111) - (7 x 7) surface and found, as a result, a faint pattern on the short-range interaction for one of the probes used in the experiments, which would have probably been obviated using human-supervised fitting strategies.
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页数：6
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