Scanned light sheet microscopy with confocal slit detection

被引:168
|
作者
Baumgart, Eugen [1 ]
Kubitscheck, Ulrich [1 ]
机构
[1] Univ Bonn, Inst Phys & Theoret Chem, D-53115 Bonn, Germany
来源
OPTICS EXPRESS | 2012年 / 20卷 / 19期
关键词
PLANE ILLUMINATION MICROSCOPY;
D O I
10.1364/OE.20.021805
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In light sheet fluorescence microscopy optical sectioning is achieved by illuminating the sample orthogonally to the detection pathway with a thin, focused sheet of light. However, light scattering within the sample often deteriorates the optical sectioning effect. Here, we demonstrate that contrast and degree of confocality can greatly be increased by combining scanned light sheet fluorescence excitation and confocal slit detection. A high frame rate was achieved by using the "rolling shutter" of a scientific CMOS camera as a slit detector. Synchronizing the "rolling shutter" with the scanned illumination beam results in confocal line detection. Acquiring image data with selective plane illumination minimizes photo-damage while simultaneously enhancing contrast, optical sectioning and signal-to-noise ratio. Thus the imaging principle presented here merges the benefits of scanned light sheet microscopy and line-scanning confocal imaging. (C) 2012 Optical Society of America
引用
收藏
页码:21805 / 21814
页数:10
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