Band alignment effects at the metal electrode interface of poly(3-hexylthiophene):zinc oxide hybrid photovoltaics

被引：2

作者：

Han, Seung Jin ^{[1
]}

Adikaari, A. A. D. T. ^{[1
]}

Jayawardena, K. D. G. I. ^{[1
]}

Nismy, N. A. ^{[1
]}

Kim, Yoon Hak ^{[2
,3
]}

Kim, Jeong Won ^{[2
,3
]}

Hahn, Yoon-Bong ^{[4
]}

Silva, S. R. P. ^{[1
]}

机构：

[1] Univ Surrey, Adv Technol Inst, Guildford GU2 7XH, Surrey, England

[2] Korea Res Inst Stand & Sci, Taejon 305340, South Korea

[3] Univ Sci & Technol, Dept Nano Sci, Taejon 305350, South Korea

[4] Chonbuk Natl Univ, Sch Chem Engn, Jeon Ju 561756, Jeonbuk, South Korea

来源：

APPLIED PHYSICS LETTERS | 2013年 / 102卷 / 08期

基金：

新加坡国家研究基金会;

关键词：

EFFICIENCY; XPS;

D O I：

10.1063/1.4794402

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Photoelectron spectroscopy is used to investigate the role of titanium oxide as an interfacial layer between a hybrid regioregular poly(3-hexylthiophene):zinc oxide photoactive layer and the Al back contact. The inspection of chemical bonds through X-ray photoemission spectroscopy core peaks indicates that the inner structure of the rr-P3HT:ZnO photo-active layer is preserved, subsequent to the deposition of the TiOx layer. Furthermore, the band alignment of rr-P3HT:ZnO/TiOx and TiOx/Al interfaces gives rise to the enhancement in device efficiency from 1.08% to 1.22% upon incorporating the TiOx layer, which is associated with the additional open circuit voltage obtained in the interface of P3HT:ZnO/TiOx. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4794402]

引用

页数：5

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