Multiplication of threading dislocations in strained metal films under sulfur exposure

被引:10
|
作者
de la Figuera, J [1 ]
Pohl, K
Schmid, AK
Bartelt, NC
Hrbek, J
Hwang, RQ
机构
[1] Sandia Natl Labs, Livermore, CA 94550 USA
[2] Brookhaven Natl Lab, Upton, NY 11973 USA
关键词
copper; dislocation multiplication; ruthenium; scanning tunneling microscopy; strained metal films; sulfur; threading dislocations;
D O I
10.1016/S0039-6028(99)00060-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Strained thin films often contain ordered networks of misfit dislocations which can determine their chemical and mechanical properties. We consider the reaction of sulfur with two-monolayer films of Cu on Ru(0001). These films contain a network of parallel partial dislocations, separating regions of fcc and hcp stacking, with threading edge dislocations where partial dislocations meet. Sulfur reacts with the threading dislocations and dissociates them. The increase in the threading dislocation density is accommodated by modifying the dislocation network. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:93 / 98
页数:6
相关论文
共 50 条
  • [11] Dynamics of threading dislocations in porous heteroepitaxial GaN films
    Gutkin, M. Yu.
    Rzhavtsev, E. A.
    PHYSICS OF THE SOLID STATE, 2017, 59 (12) : 2394 - 2400
  • [12] Atomic structure of threading dislocations in AlN thin films
    Tokumoto, Yuki
    Shibata, Naoya
    Mizoguhci, Teruyasu
    Yamamoto, Takahisa
    Ikuhara, Yuichi
    PHYSICA B-CONDENSED MATTER, 2009, 404 (23-24) : 4886 - 4888
  • [13] Is there an impact of threading dislocations on the characteristics of devices fabricated in strained-Ge substrates?
    Simoen, Eddy
    Brouwers, Gijs
    Yang, Rui
    Eneman, Geert
    Gonzalez, Mireia Bargallo
    Leys, Frederick
    De Jaeger, Brice
    Mitard, Jerome
    Brunco, David
    Souriau, Laurent
    Cody, Nyles
    Thomas, Shawn
    Lajaunie, Luc
    David, Marie-Laure
    Meuris, Marc
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 6, NO 8, 2009, 6 (08): : 1912 - +
  • [14] Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers
    Simoen, E.
    Brouwers, G.
    Eneman, G.
    Gonzalez, M. Bargallo
    De Jaeger, B.
    Mitard, J.
    Brunco, D. P.
    Souriau, L.
    Cody, N.
    Thomas, S.
    Meuris, M.
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2008, 11 (5-6) : 364 - 367
  • [15] A model for dislocations in epitaxially strained elastic films
    Fonseca, I.
    Fusco, N.
    Leoni, G.
    Morini, M.
    JOURNAL DE MATHEMATIQUES PURES ET APPLIQUEES, 2018, 111 : 126 - 160
  • [16] Etch pits and threading dislocations in GaN films grown by metal-organic chemical vapour deposition
    Lu, M
    Chang, X
    Li, ZL
    Yang, ZJ
    Zhang, GY
    Zhang, B
    CHINESE PHYSICS LETTERS, 2003, 20 (03) : 398 - 400
  • [17] Misfit dislocation generation from dissociated threading dislocations in strained-layer heterostructures
    Univ of Sydney, Sydney
    Mater Sci Forum, (279-284):
  • [18] Threading dislocations in domain-matching epitaxial films of ZnO
    Liu, W.-R.
    Hsieh, W. F.
    Hsu, C.-H.
    Liang, Keng S.
    Chien, F. S. -S.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2007, 40 : 924 - 930
  • [19] Nucleation of threading dislocations in atomistic simulations of strained layer epitaxy of III-nitrides
    Groger, Roman
    Fikar, Jan
    ACTA MATERIALIA, 2024, 264
  • [20] Identifying threading dislocations in GaN films and substrates by electron channelling
    Kamaladasa, Ranga J. .
    Liu, Fang
    Porter, Lisa M.
    Davis, Robert F.
    Koleske, Daniel D.
    Mulholland, Greg
    Jones, Kenneth A.
    Picard, Yoosuf N.
    JOURNAL OF MICROSCOPY, 2011, 244 (03) : 311 - 319