Automatic Generation of Ecore Models for Testing ATL Transformations

被引：8
|
作者：
Almendros-Jimenez, Jesus M. [1 ]
Becerra-Teron, Antonio [1 ]
机构：
[1] Univ Almeria, Dept Informat, Almeria 04120, Spain
来源：
MODEL AND DATA ENGINEERING | 2016年 / 9893卷
关键词：
D O I：
10.1007/978-3-319-45547-1_2
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Model transformation testing is crucial to detect incorrect transformations. Buggy transformations can lead to incorrect target models, either violating target meta-model requirements or more complex target model properties. In this paper we present a tool for testing ATL transformations. This tool is an extension of a previously developed tool for testing XML-based languages. With this aim an Ecore to XML Schema transformation is defined which makes to automatically generate random Ecore models possible. These randomly generated Ecore models are used to test ATL transformations. Properties to be tested are specified by OCL constraints, describing input and output conditions on source and target models, respectively.
引用
收藏
页码：16 / 30
页数：15
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