Sharp reduction of the secondary electron emission yield from grooved surfaces

被引:168
|
作者
Pivi, M. [1 ]
King, F. K. [1 ]
Kirby, R. E. [1 ]
Raubenheimer, T. O. [1 ]
Stupakov, G. [1 ]
Le Pimpec, F. [2 ]
机构
[1] Stanford Linear Accelerator Ctr, Menlo Pk, CA 94025 USA
[2] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
关键词
aluminium; copper; Monte Carlo methods; rough surfaces; secondary electron emission; titanium alloys; titanium compounds; vanadium alloys; zirconium alloys;
D O I
10.1063/1.3021149
中图分类号
O59 [应用物理学];
学科分类号
摘要
The effect of an artificially enhanced rough surface on the secondary electron yield (SEY) was investigated both theoretically and experimentally. Analytical studies on triangular and rectangular grooved surfaces show the connection between the characteristic parameters of a given geometry to the SEY reduction. The effect of a strong magnetic field is also discussed. SEY of grooved samples have been measured and the results agree with particle simulations using a Monte Carlo approach.
引用
收藏
页数:10
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