MEASUREMENT OF SECONDARY ELECTRON EMISSION FROM DIELECTRIC SURFACES

被引：12
|
作者：
HEYDT, HL
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1950年 / 21卷 / 07期
关键词：
D O I：
10.1063/1.1745674
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：639 / 643
页数：5
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