Super-Resolution: Imaging beyond the Pixel Size Limit

被引:0
|
作者
Elkhatib, Tamer A. [1 ]
Salama, Khaled N. [1 ]
机构
[1] Rensselaer Polytech Inst, Troy, NY 12181 USA
关键词
D O I
10.1109/CICC.2008.4672135
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have implemented a new high resolution imaging system independent of the image sensor's pixel size. This super-resolution is achieved by integrating a nano-aperture patterned in the first metal layer within the pixel using a standard CMOS process. The image sensor's focal plane is scanned with a sub-micron step to obtain the super-resolution image. To experimentally verify the operation of our technique, we have fabricated a standard 3-Transistors (3T) active pixel sensors with integrated nano-apertures in a 0.13 mu m CMOS technology. Here,we describe the concept of our super-resolution imaging and elaborate on our fabricated design and experimental setup.
引用
收藏
页码:515 / 518
页数:4
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