STM writing of artificial nanostructures in alkanethiol-type self-assembled monolayers

被引:11
|
作者
Hartwich, J [1 ]
Sundermann, M [1 ]
Kleineberg, U [1 ]
Heinzmann, U [1 ]
机构
[1] Univ Bielefeld, D-33615 Bielefeld, Germany
关键词
STM-lithography; SAM; e-beam lithography;
D O I
10.1016/S0169-4332(98)00862-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We report on the fabrication of artificial nanostructures in ultrathin resist films patterned by STM-lithography in ultrahigh vacuum ambience. A special type of resist, an alkanethiol-type Self-Assembled-Monolayer (SAM), has been patterned by an UHV-STM. The SAM patterns were investigated by STM without modifying the surface. Pattern width down to 15 nm were reproducibly achieved with 1 V bias voltage and 1 nA tip current. The SAM-films are formed spontaneously by immersing a Au(111)-single crystal or an appropriate gold-covered substrate into a 1 mM ethanolic solution of hexadecanthiol (CH3(CH2)(15)SH) for 24 h. The results show the capability of STM-lithography as an attractive alternative to conventional e-beam-lithography for the fabrication of lateral nanostructures in matter. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:538 / 542
页数:5
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