Modeling of silicon carbide chemical vapor deposition in a vertical reactor

被引:23
|
作者
Vorob'ev, AN
Egorov, YE
Makarov, YN
Zhmakin, AI
Galyukov, AO
Rupp, R
机构
[1] Univ Erlangen Nurnberg, Fluid Mech Dept, D-91058 Erlangen, Germany
[2] Inst Fine Mech & Opt, Comp Technol Dept, St Petersburg 119117, Russia
[3] Russian Acad Sci, AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[4] Soft Impact Ltd, St Petersburg, Russia
[5] Siemens AG, Corp Res & Dev, D-91050 Erlangen, Germany
关键词
CVD; SiC; epitaxial layer; growth rate; nucleation;
D O I
10.1016/S0921-5107(98)00496-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Chemical vapor deposition of SiC epitaxial reactor is studied experimentally and numerically. It is shown that gas phase formation of Si-droplets decreases deposition rate due to significant losses of Si. The gas phase nucleation changes C/Si ratio over the wafer and results in saturation of dependencies of the growth rate on supply of silane and propane at the values of C/Si ratio different from 1. It is found that effect of thermophoresis results in preventing Si-droplets from reaching the growing SiC surface. (C) 1999 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:172 / 175
页数:4
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