Tip-sample interaction in a "shear-force" near-field scanning optical microscope

被引：22

作者：

Hsu, K ^{[1
]}

Gheber, LA ^{[1
]}

机构：

[1] Johns Hopkins Univ, Dept Biol, Baltimore, MD 21218 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 09期

关键词：

D O I：

10.1063/1.1149967

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The interaction between the tip of a near-field scanning optical microscope (NSOM) and the sample it scans is analyzed and compared to a simple tapping model. The approach curves acquired with the NSOM are in excellent agreement with the model, and additional experiments strongly point against a noncontact interaction (such as shear force). Based on this model we are also able to explain the oscillations pattern of the feedback loop. We conclude that our straight-fiber tip, operating under "shear-force" control, intermittently contacts the surface it is scanning, in a way similar to the tapping mode in atomic force microscope. (C) 1999 American Institute of Physics. [S0034-6748(99)04509-8].

引用

页码：3609 / 3613

页数：5

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