共 50 条
- [41] Probing strain fields about thin film structures using X-ray microdiffraction THIN FILMS-STRESSES AND MECHANICAL PROPERTIES X, 2004, 795 : 289 - 294
- [45] X-ray diffraction analysis and modeling of strain induced thermal cycling in a thin aluminum(011) bicrystal film THIN FILMS: STRESSES AND MECHANICAL PROPERTIES IX, 2002, 695 : 3 - 8
- [46] X-RAY STRAIN ANALYSIS AND ELASTIC DEFORMATION OF METALS HAVING TEXTURE. Zairyo/Journal of the Society of Materials Science, Japan, 1985, 34 (380): : 493 - 498
- [48] Measurement of poisson’s ratio of a thin film on a substrate by combining x-ray diffraction with in situ substrate bending Electronic Materials Letters, 2009, 5 : 51 - 54
- [50] Characterization of Au thin film by glancing-incidence and -takeoff x-ray fluorescence spectroscopy Japanese Journal of Applied Physics, Part 2: Letters, 1994, 33 (9 A):