X-ray elastic strain analysis of compressed Au thin film on polymer substrate

被引:2
|
作者
Faurie, D. [1 ]
Renault, P. -O. [2 ]
Le Bourhis, E. [2 ]
Drouet, M. [2 ]
Goudeau, P. [2 ]
机构
[1] Univ Paris 13, LSPM CNRS, F-93430 Villetaneuse, France
[2] Univ Poitiers, ENSMA, Inst Pprime, CNRS, F-86962 Futuroscope, France
来源
关键词
X-ray strain; Elastic behavior; Flexible substrate; X-ray diffraction; CRYSTALLITE GROUP METHOD; FIBER TEXTURE; GRAIN-INTERACTION; STRESS; DIFFRACTION; CONSTANTS; SPECIMENS; TENSILE;
D O I
10.1016/j.surfcoat.2012.07.090
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper, we have compressed a strongly {111}-fiber textured gold film deposited onto a pre-stretched polymer (Kapton) substrate. The elastic strains were measured using an in situ X-ray diffraction technique. We have performed strain analysis for two geometries called longitudinal and transverse. The Neerfeld-Hill model allows capturing with a few discrepancies the non-linear experimental curves obtained in the two configurations. In contrast, the evolution of the average of the longitudinal and transverse strains as a function of sin(2) Psi is shown to be linear. This emphasizes the measurement accuracy during the compression test and is explained by the elastic grain-interaction independence of the averaged strains, even for a compression test. Moreover, we found that the gold film deforms elastically up to -0.7% (about -640 MPa). (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:322 / 326
页数:5
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