Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples

被引：57

作者：

Mandula, Ondrej ^{[1
]}

Kielhorn, Martin ^{[3
,4
]}

Wicker, Kai ^{[2
,3
]}

Krampert, Gerhard ^{[5
]}

Kleppe, Ingo ^{[6
]}

Heintzmann, Rainer ^{[2
,3
,4
]}

机构：

[1] Univ Edinburgh, Inst Adapt & Neural Computat, Edinburgh, Midlothian, Scotland

[2] Univ Jena, Inst Phys Chem, D-6900 Jena, Germany

[3] Inst Photon Technol, Jena, Germany

[4] Kings Coll London, Randall Div, London WC2R 2LS, England

[5] Carl Zeiss, Corp Res & Technol, D-07745 Jena, Germany

[6] Carl Zeiss Microscopy GmbH, D-07745 Jena, Germany

来源：

OPTICS EXPRESS | 2012年 / 20卷 / 22期

关键词：

EXCITATION MICROSCOPY; PATTERNED EXCITATION; RESOLUTION; IMPROVEMENT;

D O I：

10.1364/OE.20.024167

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen's inner structure. (C) 2012 Optical Society of America

引用

页码：24167 / 24174

页数：8

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