Neutron irradiation effects in PZ and PZT thin films

Neutron irradiation effects on highly oriented antiferroelectric PbZrO3 (PZ) and ferroelectric PbZr0.53Ti0.47O3 (PZT) thin films are investigated in view of their possible application as a temperature sensitive element in a new bolometer system for fusion devices like ITER. All investigated thin films were prepared by a sol-gel technique and by pulsed laser deposition (PLD) respectively. The dielectric properties were investigated in a frequency range from 1 to 250 kHz and at temperatures up to 400 C, prior to and after irradiation to a neutron fluence of 3 (*) 10(22) m(-2) (E > 0.1 MeV). After irradiation, the films were anneald in several steps up to 400 C in order to remove the radiation-induced defects. The results are discussed in terms of two kinds of radiation-induced defects, i.e. structural defects, such as oxygen-vacancies, and radiation-induced charges. We find that the antiferroelectric PZ heterostructures are radiation harder than the PZT films and that the structural order of the film as well as the interfaces play an important role.