Measurement of the thickness of side-polished fiber based on digital holography

被引：0
|
作者：
Wang Feng [1 ]
Ma Jie [1 ]
Chen Zhe [1 ,2 ]
Zhong Jin-gang [1 ,2 ]
Zhong Yong-chun [1 ,2 ]
机构：
[1] JinanUniv, Dept Optoelect Engn, Guangzhou 51032, Guangdong, Peoples R China
[2] JinanUniv, Key Lab Optoelect Informat & Sensing Technol Guan, Guangzhou 51032, Guangdong, Peoples R China
来源：
2015 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS | 2015年 / 9618卷
关键词：
digital holography; side-polished fibers; angular spectrum method; accurate least-squares;
D O I：
10.1117/12.2191596
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A novel method to measure the remaining cladding thickness of side-polished fiber (SPF) was demonstrated by using the digital holography technology. By using angular spectrum method and accurate least-squares phase unwrapping method, the phase distribution of SPF could be reconstructed. Based on the reconstructed phase distribution, the remaining cladding thickness of SPF could be directly measured. It can reduce the errors due to fiber's asymmetries and edge diffraction. This method could also be used to measure other special optical fibers such as photonic crystal fiber and nano-fiber.
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收藏
页数：8
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