Multilayer-oxide-based bidirectional cell selector device for cross-point resistive memory applications

被引:15
|
作者
Woo, Jiyong [1 ]
Lee, Daeseok [1 ]
Cha, Euijun [1 ]
Lee, Sangheon [1 ]
Park, Sangsu [2 ]
Hwang, Hyunsang [1 ]
机构
[1] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, South Korea
[2] Gwangju Inst Sci & Technol, Dept Nanobio Mat & Elect, Kwangju 500712, South Korea
关键词
DENSITY;
D O I
10.1063/1.4831680
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this study, we propose a multilayer structure as an insulating oxide/conducting oxide/insulating oxide for a high-performance cell selector device. To achieve a desirable selector device for cross-point memory applications, the electrical characteristics of the selector device with a multilayer oxide have been systemically investigated by using various approaches such as interface engineering and by considering factors such as material dependence. Through the introduction of a multilayer oxide, a field-sensitive device structure that exhibits a highly nonlinear I-V curve is formed. Therefore, both high current density (J(MAX) > 10(7) A/cm(2)) and better off-current (I-OFF < 100 nA) can be achieved. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] Cross-point memory design challenges and survey of selector device characteristics
    Peng, Xiaochen
    Madler, Ryan
    Chen, Pai-Yu
    Yu, Shimeng
    JOURNAL OF COMPUTATIONAL ELECTRONICS, 2017, 16 (04) : 1167 - 1174
  • [2] Diode-less bilayer oxide (WOx-NbOx) device for cross-point resistive memory applications
    Liu, Xinjun
    Sadaf, Sharif Md
    Son, Myungwoo
    Shin, Jungho
    Park, Jubong
    Lee, Joonmyoung
    Park, Sangsu
    Hwang, Hyunsang
    NANOTECHNOLOGY, 2011, 22 (47)
  • [3] Cross-point memory design challenges and survey of selector device characteristics
    Xiaochen Peng
    Ryan Madler
    Pai-Yu Chen
    Shimeng Yu
    Journal of Computational Electronics, 2017, 16 : 1167 - 1174
  • [4] Implication of Hysteretic Selector Device on the Biasing Scheme of a Cross-point Memory Array
    Aziz, Ahmedullah
    Shukla, Nikhil
    Datta, Suman
    Gupta, Sumeet Kumar
    2015 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD), 2015, : 425 - 428
  • [5] Correlated Oxide Selector for Cross-Point Embedded Non-Volatile Memory
    Luo, Yuan-Chun
    Khanna, Abhishek
    Grisafe, Benjamin
    Sun, Jiaxin
    Dutta, Sourav
    Noskin, Lindsey E.
    Adamo, Carolina
    Mei, Antonio B.
    Ghosh, Ram Krishna
    Colletta, Michael
    Holtz, M. E.
    Gambin, Vincent
    Kourkoutis, Lena F.
    Yu, Shimeng
    Schlom, Darrell G.
    Datta, Suman
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (01) : 916 - 921
  • [6] Dual-Layer Selector With Excellent Performance for Cross-Point Memory Applications
    Lin, Qi
    Li, Yi
    Xu, Ming
    Cheng, Qu
    Qian, Hang
    Feng, Jinlong
    Tong, Hao
    Miao, Xiangshui
    IEEE ELECTRON DEVICE LETTERS, 2018, 39 (04) : 496 - 499
  • [7] Cross-Point Resistive RAM Based on Field-Assisted Superlinear Threshold Selector
    Jo, Sung Hyun
    Kumar, Tanmay
    Narayanan, Sundar
    Nazarian, Hagop
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015, 62 (11) : 3477 - 3481
  • [8] Improved threshold switching characteristics of vanadium oxide/oxynitride-based multilayer selector in a cross-point array
    Kang, Dae Yun
    Rani, Adila
    Yoo, Kyoung Joung
    Kim, Tae Geun
    JOURNAL OF ALLOYS AND COMPOUNDS, 2022, 922
  • [9] Impact of Cell Failure on Reliable Cross-Point Resistive Memory Design
    Xu, Cong
    Niu, Dimin
    Zheng, Yang
    Yu, Shimeng
    Xie, Yuan
    ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2015, 20 (04)
  • [10] Cross-point Resistive Memory: Nonideal Properties and Solutions
    Wang, Chengning
    Feng, Dan
    Tong, Wei
    Liu, Jingning
    Li, Zheng
    Chang, Jiayi
    Zhang, Yang
    Wu, Bing
    Xu, Jie
    Zhao, Wei
    Li, Yilin
    Ren, Ruoxi
    ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2019, 24 (04)