Dynamic force microscopy in fluid

被引:0
|
作者
Lantz, M
Liu, YZ
Cui, XD
Tokumoto, H
Lindsay, SM [1 ]
机构
[1] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA
[2] Natl Inst Adv Interdisciplinary Res, Joint Res Ctr Atom Technol, Ibaraki, Osaka 3050046, Japan
关键词
liquid-solid interface; atomic force microscopy; dynamic force microscopy;
D O I
10.1002/(SICI)1096-9918(199905/06)27:5/6<354::AID-SIA541>3.0.CO;2-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Low-amplitude dynamic force microscopy can operate in a non-contact mode, sensing changes in liquid properties near a surface, Operation of the microscope in water at the higher amplitudes often required for stable imaging has been investigated. When driven by direct application of a force to the tip, the microscope is stable over a wide range of operating frequencies. At low frequency, the interfacial stiffness extracted from approach curves is found to be of the order of 1 N m(-1) on first contact, which is indicative of imaging: via a compressed liquid layer. Measurements of the spectral response of the cantilever and numerical simulations confirm this and show that viscous damping at the surface also plays a role. Copyright (C) 1999 John Wiley St Sons, Ltd.
引用
收藏
页码:354 / 360
页数:7
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