Dispersive-scan measurement of the fast component of the third-order nonlinearity of bulk materials and waveguides

被引：19
|
作者：
Louradour, F [1 ]
Lopez-Lago, E [1 ]
Couderc, V [1 ]
Messager, V [1 ]
Barthelemy, A [1 ]
机构：
[1] Fac Sci, UMR 6615 CNRS, Inst Rech Commun Opt & Microondes, F-87060 Limoges, France
来源：
OPTICS LETTERS | 1999年 / 24卷 / 19期
关键词：
D O I：
10.1364/OL.24.001361
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new, simple method to measure the nonlinear refraction and absorption of bulk material and waveguides is proposed. The method relies on the evolution of the intensity and width of femtosecond-pulse spectra, owing to self-phase modulation, as a function of variable chirp and stretching introduced at the input. (C) 1999 Optical Society of America OCIS codes: 190.4400, 190.4370, 190.7110.
引用
收藏
页码：1361 / 1363
页数：3
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