Reliability prediction of the high-powered LED based on dynamic neural network

被引：0
|
作者：
Yan Qiyan [1 ]
机构：
[1] Guangdong Univ Sci & Technol, Mech & Elect Engn Dept, Dongguan, Peoples R China
来源：
PROCEEDINGS FIRST INTERNATIONAL CONFERENCE ON ELECTRONICS INSTRUMENTATION & INFORMATION SYSTEMS (EIIS 2017) | 2017年
关键词：
reliability prediction; dynamic neural network; high power LED; temporal difference method;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In view of the high cost of high-powered LED reliability prediction and evaluation, a new intelligent prediction method based on dynamic neural network is proposed. The junction temperature, ideal factor, color temperature drift, color coordinate shift, color saturation and color rendering index of the high-powered white LED chip are measured as the input, and the life is measured as the output to calculate the precision of the model. The research results show that the model has good extrapolation ability and robustness, and can successfully predict the life of the high power LED in a short time. The error of test group is less than 5%.
引用
收藏
页码：778 / 781
页数：4
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