Self-consistent method for calculation of reflection coefficients of the interface with the dielectric tensor's rotation

We give an interface between two same media whose orientation of optical axis, however, is rotated, and describe a method in detail to show how to calculate reflectance coefficient in this interface. We also give the theoretical simulation of the reflectance coefficient and discuss the effect of the rotation angle and the direction of electron vector on the reflectance coefficient. For the un-polarized lights the theoretical calculated results show that the reflectance coefficients (r(x1) and r(y1)) are very small when the rotated angle is small, and they arrive at the maximum value as the rotation angle is equal to a decided value. For the polarized light, when the rotation angle is small, the reflectance coefficients (r(x1) and r(y1)) are also small. Only when the rotation angle increases to a certain extent, they can reach the maximum values and be strongly affected by the direction of electronic vector. However, this effect on the reflectance coefficient in the direction of the maximum refraction is different from that in the direction of minimum refraction.