BARIUM TITANATE THIN FILMS FOR NOVEL MEMORY APPLICATIONS

Within this work, BaNbxTi1-xO3/BaTiO3, with x=0.01 and 0.02 thin films have been epitaxially deposited by Pulsed Laser Deposition (PLD) on SrRuO3/SrTiO3, where SrRuO3 represents the bottom electrode deposited on single crystal substrate SrTiO3. At the interface, the films are expected to show the Positive Temperature Coefficient Resistor (PTCR) effect, which is a possible novel mechanism for memory applications. The phase, structure and lattice parameters have been investigated by X-ray Diffraction (XRD). Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) have been used to analyse the thickness and topography, whilst Piezoresponse Force Microscopy (PFM) has been used to visualise the ferroelectric domains.