Biological performance of calcium phosphate films formed on commercially pure Ti by electron-beam evaporation

被引:51
|
作者
Lee, IS
Kim, DH
Kim, HE
Jung, YC
Han, CH
机构
[1] Yonsei Univ, Atom Scale Surface Sci Res Ctr, Sudaemoon Ku, Seoul 120749, South Korea
[2] Seoul Natl Univ, Sch Mat Sci & Engn, Kwanak Ku, Seoul 151742, South Korea
[3] Catholic Univ Korea, Sch Med, St Vincents Hosp, Dept Dent,Paldal Ku, Suwon 442060, South Korea
[4] Yonsei Univ, Coll Dent, Young Dong Severance Hosp, Seoul 135270, South Korea
关键词
calcium phosphate; e-beam evaporation; removal torque; titanium; implant;
D O I
10.1016/S0142-9612(01)00147-8
中图分类号
R318 [生物医学工程];
学科分类号
0831 ;
摘要
Thin and defect-free Calcium phosphate films with a Ca/P ratio of 1.62 were formed by electron-beam evaporation. The as-deposited films had average bonding strengths to the metal implants of 64.8 MPa and the dissolution rates of 47.5 nm/h in isotonic saline solutions. The interface mechanical characteristics and histology of the as-machined, as-blasted, and calcium phosphate coating on the machined surfaces of commercially pure titanium were investigated. After a healing period of 12 weeks, the implants were unscrewed with a torque gauge instrument at the day of sacrifice, The coated sample showed a removal torque of 48.5 Ncm. (SD 5.4) compared to 32.3 Nem (SID 2.91) for the uncoated implant with the same surface roughness, and 47.3 Ncm (SD 5.8) for the grit blasted screw. The histomorphometric analyses of the calcium-phosphate-coated implants revealed a mean of 52.4% (SID 6.3) as the highest bone to implant contact. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:609 / 615
页数:7
相关论文
共 50 条
  • [41] Optical properties of chromium oxide thin films deposited by electron-beam evaporation
    Al-Kuhaili, M. F.
    Durrani, S. M. A.
    OPTICAL MATERIALS, 2007, 29 (06) : 709 - 713
  • [42] Properties of TiOx films prepared by electron-beam evaporation of titanium and titanium suboxides
    Waibel, F
    Ritter, E
    Linsbod, R
    APPLIED OPTICS, 2003, 42 (22) : 4590 - 4593
  • [43] SUPERCONDUCTING THIN-FILMS OF BISRCACUO MADE BY SEQUENTIAL ELECTRON-BEAM EVAPORATION
    STEINBECK, J
    ANDERSON, AC
    TSAUR, BY
    STRAUSS, AJ
    IEEE TRANSACTIONS ON MAGNETICS, 1989, 25 (02) : 2429 - 2432
  • [44] A NOVEL ELECTRON-BEAM EVAPORATION TECHNIQUE FOR THE DEPOSITION OF SUPERCONDUCTING THIN-FILMS
    KRISHNA, MG
    MURALIDHAR, GK
    RAO, KN
    RAO, GM
    MOHAN, S
    PHYSICA C, 1991, 175 (5-6): : 623 - 626
  • [45] Influence of substrate temperature on properties of ZnS films prepared by electron-beam evaporation
    Huang, Hong-Liang
    Cheng, Shu-Ying
    Huang, Bi-Hua
    Guangdianzi Jiguang/Journal of Optoelectronics Laser, 2009, 20 (03): : 355 - 358
  • [46] Study Of Stress in TiO2 films grown by electron-beam evaporation
    Chen Tao
    Luo Chong-tai
    Wang Duo-shu
    Xiong Yu-qing
    VACUUM TECHNOLOGY AND SURFACE ENGINEERING - PROCEEDINGS OF THE 9TH VACUUM METALLURGY AND SURFACE ENGINEERING CONFERENCE, 2009, : 195 - 200
  • [47] Influence of process parameters on the microstructure of scandium films deposited by electron-beam evaporation
    Wu, Qingying
    Bing, Wenzeng
    Long, Xinggui
    Zhou, Xiaosong
    Liu, Jinhua
    Luo, Shunzhong
    VACUUM, 2012, 86 (09) : 1347 - 1352
  • [48] STUDY OF TITANIUM-NITROGEN FILMS DEPOSITED IN AN ELECTRON-BEAM EVAPORATION UNIT
    BROWN, JD
    GOVERS, MR
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (05): : 2328 - 2335
  • [49] EVALUATION OF THE PERFORMANCE OF AN ELECTRON-BEAM TESTING SYSTEM BASED ON COMMERCIALLY AVAILABLE SUBSYSTEMS
    COCITO, M
    SOLDANI, D
    SCANNING ELECTRON MICROSCOPY, 1983, : 45 - 54
  • [50] Effects of ion assistance and substrate temperature on optical characteristics and microstructure of MgF2 films formed by electron-beam evaporation
    Jaing, Cheng-Chung
    Shiao, Ming-Hua
    Lee, Beng-Chung
    Lu, Chih-Jung
    Liu, Ming-Chung
    Lee, Chin-Han
    Chen, Hsi-Chao
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2006, 45 (6A): : 5027 - 5029