Transparent conductive ZnO:B films deposited by magnetron sputtering

被引:34
|
作者
Huang, Qian [1 ]
Wang, Yanfeng [1 ]
Wang, Shuo [1 ]
Zhang, Dekun [1 ]
Zhao, Ying [1 ]
Zhang, Xiaodan [1 ]
机构
[1] Nankai Univ, Inst Photo Elect Thin Film Devices & Tech, Key Lab Photo Elect Thin Film Devices & Tech Tian, Key Lab Optoelect Informat Sci & Technol,Minist E, Tianjin 300071, Peoples R China
关键词
Zinc oxide; Boron; Doped films; Electrical properties; Optical band gap; Sputtering; Deposition conditions; ZINC-OXIDE; THIN-FILMS;
D O I
10.1016/j.tsf.2012.05.014
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper focuses on the preparation of boron doped ZnO (ZnO:B) films prepared by nonreactive mid-frequency magnetron sputtering from ceramic target with 2 wt.% doping source. Adjusting power density, ZnO: B film with low resistivity (1.54x10(-3)Omega cm) and high transparency (average transparency from 400 to 1100 nm over 85%) was obtained. Different deposition conditions were introduced as substrate fixed in the target center and hydrogen mediation. Hall mobility increased from 11 to above 26 cm(2)/V.s, while carrier concentration maintained almost the same, leading to low resistivity of 6.45x10(-4)Omega cm. Transmission spectra of ZnO:B films grown at various growth conditions were determined using a UV-visible-NIR spectrophotometer. An obvious blue-shift of absorption edge was obtained while transmittances between 600 nm and 1100 nm remained almost the same. Optical band baps extracted from transmission spectra showed irregular enhancement due to the Burstein-Moss effect and band gap renormalization. Photoluminescence spectra also showed a gradual increase at UV emission peak due to free exciton transition near band gap. We contributed this enhancement in both optical band gap and UV photoluminescence emission to the lattice structure quality melioration. (C) 2012 Elsevier B. V. All rights reserved.
引用
收藏
页码:5960 / 5964
页数:5
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