Fluorinated Polyurethanes: XPS and AFM Characterization

被引:8
|
作者
Penoff, M. [1 ,2 ]
Schreiner, W. [4 ]
Oyanguren, P. [2 ,3 ]
Montemartini, P. [1 ,2 ]
机构
[1] Univ Mar del Plata, Inst Mat Sci & Technol, Composite Mat Grp, JB Justo 4302, RA-7600 Mar Del Plata, Buenos Aires, Argentina
[2] CNR, RA-7600 Mar Del Plata, Buenos Aires, Argentina
[3] Univ Mar del Plata, Inst Mat Sci & Technol, Nanomat Grp, RA-7600 Mar Del Plata, Buenos Aires, Argentina
[4] Univ Fed Parana, Surfaces & Interfaces Lab, BR-81531980 Curitiba, Parana, Brazil
关键词
atomic force micorscopy (AFM); films; fluoropolymers; polyurethane; surfaces;
D O I
10.1002/masy.201251133
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Fluorinated polyurethane films were obtained from 5-isocyanato-1(isocyanatomethyl)-1,3,3-trimethyl-cyclohexane (IPDI) and polyethylene oxide (PEO), employing two monoalcohols with different chain lenghts as fluorinated modifiers, 1H, 1H, 2H, 2H-tridecafluoro-1-n-octanol (EA600) and 1H, 1H, 2H, 2H-heptadecafluoro-1-n-decanol (EA800). X-ray photoelectron spectroscopy (XPS) has demonstrated that fluorine surface enrichment takes place. Atomic force microscopy (AFM) was employed in order to characterize films surfaces, in terms of topography and differences in hydrophobicity from light and moderate tapping conditions.
引用
收藏
页码:186 / 190
页数:5
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