Estimation of statistics properties of rough surface profiles from the Hurst exponent of speckle patterns

被引：2
|
作者：
Camargo, A. L. P. [1 ,2 ]
Dias, M. R. B. [1 ,3 ]
Lemos, M. R. [1 ]
Mello, M. M. [3 ]
da Silva, L. [1 ,3 ]
dos Santos, P. A. M. [2 ]
Huguenin, J. A. O. [1 ,2 ]
机构：
[1] Univ Fed Fluminense, Inst Ciencias Exatas, BR-27213145 Volta Redonda, RJ, Brazil
[2] Univ Fed Fluminense, Inst Fis, Av Gal Milton Tavares Souza S-N, BR-24210346 Niteroi, RJ, Brazil
[3] Univ Fed Fluminense, Escola Engn Ind Met Volta Redonda, Programa Posgrad Engn Met, Volta Redonda, RJ, Brazil
来源：
APPLIED OPTICS | 2020年 / 59卷 / 20期
关键词：
SCATTERED-LIGHT; DISPLACEMENT;
D O I：
10.1364/AO.390125
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We applied the Hurst exponent technique to an experimental study of rough metallic surface profiles and the speckle patterns generated by them. Characterization of important statistical properties of the surface profile and speckle patterns were performed. We observed a clear correlation between the Hurst exponent of a surface profile and the one calculated from the associated speckle patterns. Therefore, in principle, information of the Hurst exponent of the profile can be obtained from the Hurst exponent of speckle patterns. Range and sampling analyses were performed in the Hurst exponent calculations showing the robustness of the method. As an additional application, we performed a basic simulation to show that the Hurst exponent is sensitive to surface waviness. (C) 2020 Optical Society of America
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页码：5957 / 5966
页数：10
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