A simple and effective method for the reflection coefficient extraction in rectangular waveguide discontinuity analysis by the FDTD

被引：1
|
作者：
Yu, ZY
机构：
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 1997年 / 15卷 / 01期
关键词：
FDTD; reflection coefficient extraction; orthogonality of waveguide modes; waveguide discontinuity;
D O I：
10.1002/(SICI)1098-2760(199705)15:1<57::AID-MOP18>3.3.CO;2-P
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A simple and effective method is given for the accurate extraction of the reflection coefficient in a discontinuity simulation of the rectangular waveguide by FDTD. It uses only the values of Ex-field on two adjacent cross sections of the waveguide under investigation. Neither a presolution of a related uniform waveguide nor the monomode transmission is needed, and a reflection coefficient is extracted from a single run of FDTD. The reference planes at which the voltage time records of the dominant mode are taken can be chosen very close to the discontinuity. This results in a substantial savings in CPU time and memory storage requirements. (C) 1997 John Wiley & Sons, Inc.
引用
收藏
页码：57 / 59
页数：3
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