Production and measurement of large-area moisture barriers for electronic applications

被引:0
|
作者
Bird, David [1 ]
Cook, Andrew [1 ]
Melgari, Paolo [1 ]
Robbins, David [1 ]
Hollis, Phil [1 ]
Brewer, Paul [2 ]
Ferracci, Valerio [2 ]
机构
[1] CPI, Thomas Wright Way,NETPk, Sedgefield TS21 3FG, Durham, England
[2] Natl Phys Lab, Analyt Sci Div, Hampton Rd, Teddington TW11 0LW, Middx, England
来源
2016 6TH ELECTRONIC SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE (ESTC) | 2016年
关键词
ATOMIC LAYER DEPOSITION; WATER-VAPOR; PERFORMANCE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The use of organic electronic materials, combined with the desire to produce lightweight & low cost flexible devices, raises the need to develop a commercially viable technology which limits the impact of the active material's intrinsic environmental instability. CPI has been involved in the area of barrier film and encapsulation development for many years and with its development with Beneq of R2R Atomic Layer Deposition (ALD) processes is actively engaging with the industry to meet this technology need. This work reviews the existing technologies and highlights the barrier and associated metrology technologies being developed at CPI's National Printable Electronics Facility, including a variant of calcium-test which has been calibrated to the mass standard. The aim of all this work is to reduce costs and improve the manufacturability of these materials for a commercial/industrial environment.
引用
收藏
页数:6
相关论文
共 50 条
  • [41] Stepwise measurement procedure for the characterization of large-area photovoltaic modules
    Rapp, Christoph
    Steiner, Marc
    Siefer, Gerald
    Bett, Andreas W.
    PROGRESS IN PHOTOVOLTAICS, 2015, 23 (12): : 1867 - 1876
  • [42] DEFINITION AND MEASUREMENT OF THE EARTH RESISTANCE OF AN ELECTRODE COVERING A LARGE-AREA
    CORBELLINI, G
    CORBELLINI, U
    EUROPEAN TRANSACTIONS ON ELECTRICAL POWER ENGINEERING, 1995, 5 (03): : 173 - 180
  • [43] Line spectroscopic reflectometry for rapid and large-area thickness measurement
    Lee, Minchol
    Park, Jaehyun
    Kim, Jeongmin
    OPTICS EXPRESS, 2023, 31 (20) : 32241 - 32252
  • [44] Measurement of LED chips using a large-area silicon photodiode
    Chou, Pei-Ting
    Ying, Shang-Ping
    Chen, Tzung-Te
    Fu, Han-Kuei
    Wang, Chien-Ping
    Lee, Chih-Kung
    APPLIED OPTICS, 2014, 53 (29) : H44 - H50
  • [45] HIGH-SPEED MEASUREMENT METHODS FOR LARGE-AREA OLEDS
    Leise, N.
    Gerloff, T.
    Sperling, A.
    Kueck, S.
    PROCEEDINGS OF CIE 2016 LIGHTING QUALITY AND ENERGY EFFICIENCY, 2016, : 311 - 317
  • [46] Large-area mobile measurement of outdoor exposure to radio frequencies
    Paniagua-Sanchez, Jesus M.
    Garcia-Cobos, Francisco J.
    Rufo-Perez, Montana
    Jimenez-Barco, Antonio
    SCIENCE OF THE TOTAL ENVIRONMENT, 2023, 877
  • [47] Large-Area Surface Measurement of Spherical Parts Based on Interferometry
    Jiao, Sicheng
    Wang, Junhua
    Gao, Minge
    Huang, Daixin
    Ji, Fang
    Xu, Min
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2025, 74
  • [48] Terahertz large-area unidirectional surface magnetoplasmon and its applications
    Qian Shen
    Jinhua Yan
    Yun You
    Senpeng Li
    Linfang Shen
    Scientific Reports, 13
  • [49] LARGE-AREA PULSED-LASER DEPOSITION - TECHNIQUES AND APPLICATIONS
    GREER, JA
    TABAT, MD
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (03): : 1175 - 1181
  • [50] Large-area nanogap plasmon resonator arrays for plasmonics applications
    Jin, Mingliang
    van Wolferen, Henk
    Wormeester, Herbert
    van den Berg, Albert
    Carlen, Edwin T.
    NANOSCALE, 2012, 4 (15) : 4712 - 4718